High-pressure x-ray diffraction and Raman spectroscopy of Hf V 2 O 7 - Université de Toulon Access content directly
Journal Articles Physical Review B: Condensed Matter and Materials Physics (1998-2015) Year : 2004
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hal-01727428 , version 1 (09-03-2018)

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U. Hemamala, F. El-Ghussein, M. Goedken, B. Chen, Christine Leroux, et al.. High-pressure x-ray diffraction and Raman spectroscopy of Hf V 2 O 7. Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2004, 70 (21), ⟨10.1103/PhysRevB.70.214114⟩. ⟨hal-01727428⟩
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